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Product Details:
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| Color: | White | Customization: | OEM, ODM |
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| Packing: | 1 PC/Carton | Warranty: | 1 Year |
| Lead-time: | 40 Work Days | Supply Ability: | 10 PCS/Month |
| Resolution: | 5nm | Magnification: | 150,000X |
| Accelerating Voltage: | 1kV To 30kV | Signal Detection: | (SEI)-Secondary Electron Image |
| Electron Gun: | Filament Type, Pre Centered Tungsten Filament Cartridge | Max Sample Size: | 80mm In Diameter, 35mm In Height |
| Image Format: | BMP, JPEG, PNG,TIFF | Vacuum System: | High Vacuum Mode |
| High Light: | Max 150000X Scanning Electron Microscope,5nm Resolution BSE Scanning Electron Microscope,5nm backscattered electron microscope |
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Magnification Max 150,000X Scanning Electron Microscope 5nm Resolution with Optional EDS and BSE
The maximum magnification of the M22002 series SEM is 150,000 times, and the resolution is up to 5nm (SE, 30kV). It is equipped with SE (secondary electron) detector and BSE (backscattered electron) detector. The load platform can be configured with three axes (X, Y, R). The manual platform can also be upgraded to a five-axis (X, Y, R, Z, T) automatic platform. The EDS spectrum analyzer can be configured in all series of products.
Specials:
| Item | Specification | M22002 | |
| Resolution | 5nm (30kV, SE Image) | ● | |
| Magnification | 30x~150,000x | ● | |
| Accelerating Voltage | 1kV to 30kV (1kV/5kV/10kV/15kV/20kV/30kV) | ● | |
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Signal Detection
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(SEI)-Secondary Electron Image | ● | |
| (BSEI)-Backscattered Electron Image | ○ | ||
| Observation mode | Standard Mode | ● | |
| Electron Gun | Filament type, Pre Centered tungsten filament Cartridge | ● | |
| Bias voltage system, Automatic mode | ● | ||
| Electron gun alignment, Manual mode | ● | ||
| Lens system | Focus Lens, 2-stage Electromagnetic Condenser Lens | ● | |
| Objective Lens, 1-stage Electromagnetic Objective Lens | ● | ||
| Detector type, SE Detector/ BSE Detector | ● | ||
| Stage Traverse | 5-axis System, X, Y-axis: 40mm / R-axis: 360°, Z: 0~35mm / Tilt-axis: 0~45° | ● | |
| Image shift | Image shift X, Y Image Shift (±150um) | ● | |
| Max Sample size | 80mm in diameter, 35mm in height | ● | |
| Image Scanning system | Fast Scan: 320x240 | ● | |
| Slow Scan: 640x480 | ● | ||
| Photo Mode 1: 1280x960 | ● | ||
| Photo Mode 2: 2560x1920 | ● | ||
| Photo Mode 3: 5120x3840 | ● | ||
| Image format | BMP, JPEG, PNG,TIFF | ● | |
| Data display | Magnification,Detector type,Accelerating Voltage,Vacuum mode,Logo(Text),Date and time,Text marker,scale bar | ● | |
| Vacuum system |
High Vacuum Mode Rotary Pump/100Liters/min |
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| Control unit system |
Mouse, Keyboard PC: Desk Top USB 2.0 |
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| Software function | Image file open, edit, Save function Length, area, angle measuring parameter initialization,Image capture mode conversion,Archives, Setting(EDS Optional) |
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| Volume |
Main Unit -460(W)×600(D)×950(H)mm……1set External vacuum pump)-400(W)×160(D)×340(H)mm …1set |
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| Weight | 105kg | ● | |
| Equipment environment |
Temperature: 15℃~30℃ Humidity: 70% or less Power source: Single phase 220V AC, 1KW, 50/60Hz |
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Accessories package: |
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| Pre Centered tungsten filament | 5 pcs/box | ● | |
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Sample Stage
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15mm dia. (10 pcs) | ● | |
| 25mm dia. (10 pcs) | ● | ||
| 15mm 45° Tilt (5 pcs) | ● | ||
| 15mm 90° Tilt (5pcs) | ● | ||
| Height standard master | 1ea | ● | |
| allen wrench | 1set | ● | |
| SEM Software CD | 1ea | ● | |
| Carbon conductive tape | 1roll | ● | |
| scissors | 1ea | ● | |
| tweezers | 1ea | ● | |
| Tools Box | 1ea | ● | |
Note: ● means standard, ○ means optional
Part of images:
New energy materials
Industrial materials
Tin ball
Acrylic
Medical filter
Foaming material
Si3N4 material
Carbon
Carbon fiber
Fiber
Nano-permeable membrane
Super zinc activator
Diamond powder
Diamond powder 2
Neodymium iron boron magnet
Ferromagnet
Y phase in steel materials
Diamond cutter
Silicon ball
Gold particles
Iron powder
Security material
Ceramic
Ceramic implant substrate
Contact Person: Johnny Zhang
Tel: 86-021-37214606
Fax: 86-021-37214610
